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Semiconductor Memories: Technology, Testing, and Reliability Ashok K. Sharma
Publisher: Wiley-IEEE Press

Description détaillée de ce document : Lancez une recherche dans le catalogue de la Bibliothèque. More pins means more manufacturing issues and reliability starts to drop. Prior to that, he was vice president of marketing and sales for Agilent Technologies' Semiconductor Memory Test products. This improves the throughput of both tion of state-of-the-art flash memory cell technologies. He has over 23 years of executive and general management, operations, I look forward to working with Rhea and the Aehr Test team to profitably expand our company while continuing to satisfy customers' needs with cost effective, highly reliable, and flexible test solutions." About Aehr Test Systems. Analysis of broader semiconductor strategies and significant industry-wide issues including DRAM, NAND, NOR, ReRAM, PCM, FRAM, MRAM, STT MRAM, TAS MRAM, Multi-Die Packages, System-Level Test and Design of Multi-Die and error-correction requirements necessary to assure the reliability of the data, will slow the rate of decline in the bit cost of the memory technology and provide market entry points for newer semiconductor memory technologies. Download Semiconductor Memories: Technology, Testing, and Reliability. Current and cutting-edge semiconductor technologies. Download Semiconductor Memories Semiconductor Memories: Technology, Testing, and Reliability. Semiconductor Memories: Technology, Testing, and Reliability Ashok K. Due to more pins and higher speeds; Standards compliance (need to build this in from the start); Signal integrity (increasingly critical as transfer rates rise); Timing margin; Probability (for physical testing of manufactured systems). Consequently, the semiconductor memory industry has been and is evolving different interface standards to meet the divergent needs of these application markets. The 4082A's and 4082F's revolu- tionary test capabilities provide benefits for both current and advanced production parametric test. The 4082A combines digital archi- tecture improvements and an ultra-fast CPU with synchronous and asynchronous parallel test capabilities. Semiconductor memories technology, testing, and reliability. Semiconductor Memories book download. This book tries to bring order to the vast amount.